Open-ILS/tests/datasets/RDA/RDA_record_SERIAL_IEEE_International_conference.mrc

   1 00854cas a22002295i 4500001000900000005001700009008004100026906004500067925004400112955004100156040002300197042000800220245010100228246001100329264007700340300003500417336002100452337002500473338002300498588004400521710005900565\1e17568399\1e20130213162001.0\1e121219cuuuu9999xxu | |       0    0eng  \1e  \1fa0\1fbibc\1fcserials\1fd*\1fencip\1ff20\1fgz-ilsserca\1e0 \1faacquire\1fb1 shelf copies\1fxpolicy default\1e  \1fbrh13 2012-12-19 to Selection Officer\1e  \1faDLC\1fbeng\1fcDLC\1ferda\1e  \1fapcc\1e00\1faIEEE International conference on software testing, verification and validation :\1fb[proceedings].\1e1 \1fa(ICST)\1e 1\1faPiscataway, NJ :\1fbInstitute of Electrical and Electronic Engineers, Inc.\1e  \1favolumes :\1fbillustrations ;\1fccm\1e  \1fatext\1f2rdacontent\1e  \1faunmediated\1f2rdamedia\1e  \1favolume\1f2rdacarrier\1e  \1faDescription based on: 5th, (ICST 2012).\1e2 \1faInstitute of Electrical and Electronic Engineers, Inc.\1e\1d